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Noise reduction in CCD measurements by improving the quality of dark-reference images

Abstract This publication is a systematic investigation of the effect the improvement of dark-reference images has on the resulting bright-field images. For this, data were acquired with three different charge-coupled device cameras attached to two different transmission electron microscopes. Multi-frame acquisitions and methods to correct x-ray noise are introduced and quantified as options to improve the dark-reference images. Furthermore, the influence of x-ray noise on transmission electron microscopy measurements is discussed and observations on its composition are shared.

Autoren:   Heil T, Tatlock G.
Journal:   Journal of Electron Microscopy
Band:   67
Ausgabe:   suppl_1
Jahrgang:   2018
Seiten:   i123
DOI:   10.1093/jmicro/dfy006
Erscheinungsdatum:   13.02.2018
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