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Effect of UV radiation damage in air on polymer film thickness, studied by soft X-ray spectromicroscopy

The thicknesses of thin films of polystyrene (PS), poly(methyl methacrylate) (PMMA), and perfluorosulfonic acid (PFSA) were measured by Ultraviolet Spectral Reflectance (UV-SR) and Scanning Transmission X-ray Microscopy (STXM). At high doses, the UV irradiation in air used in the UV-SR method was found to modify th

Autoren:   Lis G. A. Melo; Adam P. Hitchcock; Darija Susac; Juergen Stumper; Viatcheslav Berejnov
Journal:   Physical Chemistry Chemical Physics
DOI:   10.1039/C7CP08621K
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