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Single Defect Center Scanning Near-Field Optical Microscopy on Graphene

We present a scanning-probe microscope based on an atomic-size emitter, a single nitrogen-vacancy center in a nanodiamond. We employ this tool to quantitatively map the near-field coupling between the NV center and a flake of graphene in three dimensions with nanoscale resolution. Further we demonstrate universal energy transfer distance scaling between a point-like atomic emitter and a two-dimensional acceptor. Our study paves the way toward a versatile single emitter scanning microscope, which could image and excite molecular-scale light fields in photonic nanostructures or single fluorescent molecules.

Autoren:   Julia Tisler; Thomas Oeckinghaus; Rainer J. Stöhr; Roman Kolesov; Rolf Reuter; Friedemann Reinhard; Jörg Wrachtrup
Journal:   Nano Letters
Jahrgang:   2013
DOI:   10.1021/nl401129m
Erscheinungsdatum:   28.06.2013
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